XLE-3 10, Wafer Inspection Microscope, Metallurgical Microscopes, Lab Microscopes

XLE-3 10, Wafer Inspection Microscope

• Product Name:
  Wafer Inspection Microscope
  
  
• Model Number:
  XLE-3 10
  
  
• Description:
  The XLE-3 series reflected light inspection microscope is the newest medium inspection microscope in China. The adoption of reflected coaxial illumination ensures the bright-field observation. It can be connected with 135 camera, digital camera and image quantitative analysis. This instrument is suitable for the inspection requirements of a variety of electronic components including magnetic heads, LCD, and semiconductors. Its compact size, ease of operation, 10" x 10" stage travel and cost-effectiveness makes the XLE-3 an ideal inspection microscope offering superb operational versatility. The instrument is equipped with plan objective and wide-field eyepiece and obtains clear and smooth image. The unique character is the super large stage which can make quick-handed and knob-fine movement. The samples on the stage can be moved vertically and horizontally.
  
  
  Learn more about products detailed description, pricing and service, Please send mail to us!